Melotte Successfully Installs amsight as Full-Process Data System, Marking the Next Step Toward Reducing CT Scanning Efforts

Today, the partners announced the successful operational implementation of a comprehensive data capturing system at Melotte’s facility, marking a critical step in the industrialization of semiconductor component manufacturing.

EINDHOVEN (NL) / ZONHOVEN (BE) / HAMBURG (DE) — February 2026 — While the additive manufacturing (AM) industry has long discussed "data-driven production," Melotte, Additive Center, and amsight GmbH have officially moved beyond theory. Today, the partners announced the successful operational implementation of a comprehensive data capturing system at Melotte's facility, marking a critical step in the industrialization of semiconductor component manufacturing.


Breaking the "Printer-Only" Data Silo
Unlike many current industry initiatives that focus solely on capturing data from the 3D printing process, this implementation integrates Melotte's entire production chain. The system captures structured data from the moment raw material enters the facility, through the build process, post-processing, and final CT scanning, creating a single, connected view of each part's history.
For semiconductor suppliers, this represents a shift from reactive, inspection-based quality control to proactive, data-driven quality assurance at process level.

Why This Matters for the Semiconductor Ecosystem
The semiconductor industry demands unprecedented levels of traceability and process stability. By reducing dependence on 100% end-of-line inspections and building a digital quality backbone instead, Melotte is establishing a scalable blueprint for the semiconductor supplier network and other high-tech value chains in the Netherlands region.

• Total Traceability: Every variable - from powder chemistry to final internal geometry - is linked in a single digital thread.
• Operational Reality: This is not a laboratory test; the amsight software suite is fully operational within Melotte's industrial environment and integrated into day-to-day workflows.
• From Inspection to Prediction: Structured process data can now be visualised to show process stability and variation, enabling the introduction of Statistical Process Control (SPC) and deeper process understanding.

"The industry often mistakes 'machine monitoring' for 'process control,'" says Harry Kleijnen, Additive Center. "What we have achieved with Melotte and amsight is the integration of the total process. We aren't just looking at the laser; we are looking at the entire lifecycle of the part. This is the first step towards increasing process understanding and thus reducing the use of CT scanning."

The Path Forward: Defining the New Standard
With the system now operational, the next phase involves analyzing historical data to identify Critical-to-Quality (CTQ) parameters. This will allow Melotte to reduce inspection overhead while increasing compliance and predictability - offering a competitive edge in a supply chain where "first-time-right production" is the ultimate goal.

Additive Center, together with amsight GmbH as a technology enabler, views transparent, end-to-end process understanding as essential to the industrialization of additive manufacturing in the semiconductor industry.

Rather than treating data-driven quality assurance as an optional optimisation, Additive Center positions it as a foundational element for achieving predictability, manufacturability, and sustained industrial adoption of AM across the semiconductor value chain.

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